Opening book details…
About this Engineering article
A Simple Approach to Fine Wire Diameter Measurement Using a High-resolution Flatbed Scanner by C. W. Kee; M. M. Ratnam is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- C. W. Kee; M. M. Ratnam
- Publisher
- Springer; Springer-Verlag; Springer Verlag; Springer Science and Business Media LLC; Society for Mining, Metallurgy and Exploration Inc. (ISSN 0268-3768)
- Published
- 2008
- Language
- EN
- Field
- Engineering (Physical Sciences)