About this scholarly article

SPIE Proceedings [SPIE Asia-Pacific Conference on Fundamental Problems of Opto- and Microelectronics - Khabarovsk, Russia (Tuesday 11 October 2016)] Asia-Pacific Conference on Fundamental Problems of Opto- and Microelectronics - High spatial resolution absorption contrast imaging with electron-beam excitation assisted optical microscope by Kulchin, Yuri N.; Romashko, Roman V.; Syuy, Alexander V.; Inami, Wataru; Fukuta, Masahiro; Kawata, Yoshimasa; Terakawa, Susumu is a scholarly article available to read on EtoBox.

Author

Kulchin, Yuri N.; Romashko, Roman V.; Syuy, Alexander V.; Inami, Wataru; Fukuta, Masahiro; Kawata, Yoshimasa; Terakawa, Susumu

Publisher

SPIE

Published

2016

Language

EN