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Can I read Defects and Their Charge Imaging on Semiconductor Surfaces by Noncontact Atomic Force Microscopy and Spectroscopy on EtoBox?
Defects and Their Charge Imaging on Semiconductor Surfaces by Noncontact Atomic Force Microscopy and Spectroscopy by S Morita; M Abe; K Yokoyama; Y Sugawara is a Engineering article available to read on EtoBox.
What is Defects and Their Charge Imaging on Semiconductor Surfaces by Noncontact Atomic Force Microscopy and Spectroscopy about?
By using the noncontact atomic force microscope (AFM), at "rst, the optimal distance to image atomic point defects and periodic lattice structure was clari"ed on p-GaAs(1 1 0) cleaved surface. Next, Fe-doped semi-insulating InP(1 1 0) cleaved surface was observed, where various kinds of atomic point defects such as defects with di!erent depths, and also mobile and immobile atomic defects were found. Finally, the atomic corrugation and the charge of atomic point defects on n>-GaAs(1 1 0) cleaved surface were imaged, simultaneously. It showed clearly that there are atomic point defects with and without point charge, and that the sign of point charge is positive. Further, the electron clouds which screen positive point charges on the surface and also below the surface were observed.
Who reads Defects and Their Charge Imaging on Semiconductor Surfaces by Noncontact Atomic Force Microscopy and Spectroscopy?
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- S Morita; M Abe; K Yokoyama; Y Sugawara
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0022-0248)
- Published
- 2000
- Language
- EN
- Field
- Engineering (Physical Sciences)