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Improving Feature Size Uniformity from Interference Lithography Systems with Non-uniform Intensity Profiles by Chang, En-Chiang; Mikolas, David; Lin, Pao-Te; Schenk, Tony; Wu, Chien-Li; Sung, Cheng-Kuo; Fu, Chien-Chung is a Materials Science article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Materials Science.

Author
Chang, En-Chiang; Mikolas, David; Lin, Pao-Te; Schenk, Tony; Wu, Chien-Li; Sung, Cheng-Kuo; Fu, Chien-Chung
Publisher
Institute of Physics; IOP Publishing; Institute of Physics Publishing (ISSN 0957-4484)
Published
2013
Language
EN
Field
Materials Science (Physical Sciences)

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