About this scholarly article

2017 IEEE Asia Pacific Microwave Conference (APMC) - An M-sequence reflection measurement system by Notzon, Gordon; Polzin, Lukas; Falkenberg, Dennis; Storch, Robert; Musch, Thomas; Vogt, Michael is a scholarly article available to read on EtoBox.

Author

Notzon, Gordon; Polzin, Lukas; Falkenberg, Dennis; Storch, Robert; Musch, Thomas; Vogt, Michael

Publisher

IEEE

Published

2017