About this scholarly article

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 29 July 2001)] X-Ray Micro- and Nano-Focusing: Applications and Techniques II - Experimental analysis of high-resolution soft x-ray microscopy by Chao, Weilun; Anderson, Erik H.; Denbeaux, Gregory; Harteneck, Bruce D.; Pearson, Angelic L.; Olynick, Deirdre L.; Schneider, Gerd; Attwood, Jr., David T.; McNulty, Ian is a scholarly article available to read on EtoBox.

Author

Chao, Weilun; Anderson, Erik H.; Denbeaux, Gregory; Harteneck, Bruce D.; Pearson, Angelic L.; Olynick, Deirdre L.; Schneider, Gerd; Attwood, Jr., David T.; McNulty, Ian

Publisher

SPIE

Published

2001

Language

EN