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About this Engineering article
Defect Characterisation Based on Pulsed Eddy Current Imaging Technique by Yunze He; Feilu Luo; Mengchun Pan is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Yunze He; Feilu Luo; Mengchun Pan
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0924-4247)
- Published
- 2010
- Field
- Engineering (Physical Sciences)