About this scholarly article

SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California, United States (Saturday 7 February 2015)] Gallium Nitride Materials and Devices X - Strong carrier localization in stacking faults in semipolar (11-22) GaN by Chyi, Jen-Inn; Fujioka, Hiroshi; Morkoç, Hadis; Okur, Serdal; Monavarian, Morteza; Das, Saikat; Izyumskaya, Natalia; Zhang, Fan; Avrutin, Vitaliy; Morkoç, Hadis; Özgür, Ümit is a scholarly article available to read on EtoBox.

Author

Chyi, Jen-Inn; Fujioka, Hiroshi; Morkoç, Hadis; Okur, Serdal; Monavarian, Morteza; Das, Saikat; Izyumskaya, Natalia; Zhang, Fan; Avrutin, Vitaliy; Morkoç, Hadis; Özgür, Ümit

Publisher

SPIE

Published

2015

Language

EN