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About this Engineering article
A Global Quality Measurement of Pan-Sharpened Multispectral Imagery by Alparone, L.; Baronti, S.; Garzelli, A.; Nencini, F. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Alparone, L.; Baronti, S.; Garzelli, A.; Nencini, F.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 1545-598X)
- Published
- 2004
- Language
- EN
- Field
- Engineering (Physical Sciences)
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