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About this Engineering article
Investigation of the drain-induced barrier lowering of low-temperature polycrystalline silicon TFTs depending on the grain configuration and channel length by Moon, GeumJu; Sohn, YoungHa; Choi, KwangHyun; Kim, YongSang; Park, KeeChan is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Moon, GeumJu; Sohn, YoungHa; Choi, KwangHyun; Kim, YongSang; Park, KeeChan
- Publisher
- Informa UK (Taylor & Francis); Taylor & Francis; Informa UK Limited (ISSN 1598-0316)
- Published
- 2017
- Language
- EN
- Field
- Engineering (Physical Sciences)
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