Opening book details…
About this nonfiction
2020 IEEE International Test Conference (ITC) by Baby, Manu (author);Buttner, Bernd (author);Engelke, Piet (author);Pfannkuchen, Ulrike (author);Meier, Reinhard (author);Gaudet, Jonathan (author);Cote, J-F (author);Danialy, Givargis (author);Keim, Martin (author);Schramm, Lori (author) is a nonfiction available to read on EtoBox.
It is typically read by self-directed learners exploring a subject in depth.
Common subject areas: history, science, philosophy, social sciences.
- Author
- Baby, Manu (author);Buttner, Bernd (author);Engelke, Piet (author);Pfannkuchen, Ulrike (author);Meier, Reinhard (author);Gaudet, Jonathan (author);Cote, J-F (author);Danialy, Givargis (author);Keim, Martin (author);Schramm, Lori (author)
- Publisher
- IEEE
- Published
- 2020
- Language
- EN
- Category
- nonfiction