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About this Engineering article
Electrical Characteristics Temperature Dependence of 600V-Class Deep Implanted Gate Vertical JFET by Mizukami, Makoto; Takikawa, Osamu; Imai, Seiji; Kinoshita, Kozo; Hatakeyama, Tetsuo; Domon, Tomokazu; Shinohe, Takashi is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Mizukami, Makoto; Takikawa, Osamu; Imai, Seiji; Kinoshita, Kozo; Hatakeyama, Tetsuo; Domon, Tomokazu; Shinohe, Takashi
- Publisher
- Trans Tech Publications, Ltd.; Trans Tech Publications Ltd. (ISSN 1662-9752)
- Published
- 2005
- Language
- EN
- Field
- Engineering (Physical Sciences)