About this scholarly article

2020 IEEE International Reliability Physics Symposium (IRPS) - ESD Robustness of GaN-on-Si Power Devices under Substrate Biases by means of TLP/VFTLP Tests by Yang, Wen; Stoll, Nicholas; Yuan, Jiann-Shiun is a scholarly article available to read on EtoBox.

Author

Yang, Wen; Stoll, Nicholas; Yuan, Jiann-Shiun

Publisher

IEEE

Published

2020