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Feature Selection for Fault Detection and Prediction based on Event Log Analysis by Zhong Li; Matthijs van Leeuwen is a Computer Science article available to read on EtoBox.

What is Feature Selection for Fault Detection and Prediction based on Event Log Analysis about?

Event logs are widely used for anomaly detection and prediction in complex systems. Existing log-based anomaly detection methods usually consist of four main steps: log collection, log parsing, feature extraction, and anomaly detection, wherein the feature extraction step extracts useful features for anomaly detection by counting log events. For a complex system, such as a lithography machine consisting of a large number of subsystems, its log may contain thousands of different events, resulting in abounding extracted features. However, when anomaly detection is performed at the subsystem level, analyzing all features becomes expensive and unnecessary. To mitigate this problem, we develop a feature selection method for log-based anomaly detection and prediction. Specifically, our method consists of three main modules: the Log Event Vectorization module that converts semi-structured log texts into time series; the Selection of Relevant Features module that leverages Kendall rank correlation and Granger causality test to select log events for fault detection and prediction; and the Removal of Redundant Features module that utilises Kendall rank correlation to reduce redundant log eve

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Author

Zhong Li; Matthijs van Leeuwen

Publisher

ACM

Published

2022

Language

EN

Field

Computer Science (Physical Sciences)