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About this Materials Science article
Effect of annealing ambient on structure and ferroelectric properties of Pb(Zr0.4Ti0.6)O3 thin films on LaNiO3 coated Si substrates by J.H. Ma; X.J. Meng; J.L. Sun; T. Lin; F.W. Shi; J.H. Chu is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- J.H. Ma; X.J. Meng; J.L. Sun; T. Lin; F.W. Shi; J.H. Chu
- Publisher
- Elsevier Science; Elsevier ; Elsevier Ltd.; Elsevier BV (ISSN 0025-5408)
- Published
- 2005
- Language
- EN
- Field
- Materials Science (Physical Sciences)
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