About this scholarly article

2015 International Symposium on Next-Generation Electronics (ISNE) - A gate-oxide-breakdown antifuse OTP ROM array based on TSMC 90nm process by Liu, Zicheng; Zheng, Ruifeng; Sun, Jianwei is a scholarly article available to read on EtoBox.

Author

Liu, Zicheng; Zheng, Ruifeng; Sun, Jianwei

Publisher

IEEE

Published

2015

Language

EN