About this scholarly article

2008 IEEE Radio Frequency Integrated Circuits Symposium - Effect of technology scaling on RF performance of the transistors fabricated by standard CMOS technology by Han-Su Kim, ; Chulho Chung, ; Joohyun Jeong, ; Seung-Jae Jung, ; Jinsung Lim, ; JinHyoun Joe, ; Jaehoon Park, ; HyunWoo Lee, ; Gwangdoo Jo, ; Kangwook Park, ; Jedon Kim, ; Hansu Oh, ; Jong Shik Yoon, is a scholarly article available to read on EtoBox.

Author

Han-Su Kim, ; Chulho Chung, ; Joohyun Jeong, ; Seung-Jae Jung, ; Jinsung Lim, ; JinHyoun Joe, ; Jaehoon Park, ; HyunWoo Lee, ; Gwangdoo Jo, ; Kangwook Park, ; Jedon Kim, ; Hansu Oh, ; Jong Shik Yoon,

Publisher

IEEE

Published

2008

Language

EN