About this scholarly article

1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century - Next Generation Test Generator (NGTG) interface to Automatic Test Equipment (ATE) for digital circuits by West, C.M. is a scholarly article available to read on EtoBox.

Author

West, C.M.

Publisher

IEEE

Published

1997

Language

EN