About this scholarly article

SPIE Proceedings [SPIE Technical Symposium Southeast - Orlando, FL (Monday 18 May 1987)] Infrared Image Processing and Enhancement - Deformation-Tolerant Statistical Correctors For Enhancement Of Ship Silhouette Recognition by Schmalz, Mark S.; Caimi, Frank M.; Weathersby, Marshall R. is a scholarly article available to read on EtoBox.

Author

Schmalz, Mark S.; Caimi, Frank M.; Weathersby, Marshall R.

Publisher

SPIE

Published

1987