About this scholarly article

Fourth IEEE Region 10 International Conference TENCON - An artificial intelligence approach to trouble-shooting in automatic test equipment by Aswathanarayana, ; Krishnamurthy, S.; Manoharan, A. is a scholarly article available to read on EtoBox.

Author

Aswathanarayana, ; Krishnamurthy, S.; Manoharan, A.

Publisher

IEEE

Published

1989

Language

EN