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Temperature-dependent direct transition energy in Ge0.99Sn0.01 film grown on Si measured by photoreflectance spectroscopy by Jo, Hyun-Jun; So, Mo Geun; Kim, Jong Su; Ryu, Mee-Yi; Yeo, Yung Kee; Kouvetakis, John is a Engineering article available to read on EtoBox.
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- Author
- Jo, Hyun-Jun; So, Mo Geun; Kim, Jong Su; Ryu, Mee-Yi; Yeo, Yung Kee; Kouvetakis, John
- Publisher
- Elsevier Science; Elsevier ; Elsevier Sequoia; Elsevier BV (ISSN 0040-6090)
- Published
- 2015
- Field
- Engineering (Physical Sciences)