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About this Engineering article
Fatigue Damage at the Root of the Gate Lip of the Water Gate under Variable Water Pressure due to Tide and Ocean Wave by Konuma, Keitaro ;Toyosada, Masahiro ;Gotoh, Koji ;Kawai, Koji ;Igarashi, Noboru is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Konuma, Keitaro ;Toyosada, Masahiro ;Gotoh, Koji ;Kawai, Koji ;Igarashi, Noboru
- Publisher
- Japan Society of Naval Architects and Ocean Engineers (ISSN 0514-8499)
- Published
- 2004
- Field
- Engineering (Physical Sciences)
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