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About this Engineering article
Conductance measurement of a DNA network in nanoscale by point contact current imaging atomic force microscopy by Terawaki, Ayumu; Otsuka, Yoichi; Lee, HeaYeon; Matsumoto, Takuya; Tanaka, Hidekazu; Kawai, Tomoji is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Terawaki, Ayumu; Otsuka, Yoichi; Lee, HeaYeon; Matsumoto, Takuya; Tanaka, Hidekazu; Kawai, Tomoji
- Publisher
- American Institute of Physics; AIP Publishing (ISSN 0003-6951)
- Published
- 2005
- Language
- EN
- Field
- Engineering (Physical Sciences)