About this scholarly article

2014 IEEE 23rd Asian Test Symposium - Built-In Scrambling Analysis for Yield Enhancement of Embedded Memories by Lu, Shyue-Kung; Jheng, Hao-Cheng; Lin, Hao-Wei; Hashizume, Masaki; Kajihara, Seiji is a scholarly article available to read on EtoBox.

Author

Lu, Shyue-Kung; Jheng, Hao-Cheng; Lin, Hao-Wei; Hashizume, Masaki; Kajihara, Seiji

Publisher

IEEE

Published

2014