About this scholarly article

2004 IEEE Radiation Effects Data Workshop (IEEE Cat. No.04TH8774) - In-flight observations of long-term single event effect (SEE) performance on X-ray Timing Explorer (XTE) solid-state recorders (SSRs) [SRAM] by Poivey, C.; Gee, G.; LaBel, K.A.; Barth, J.L. is a scholarly article available to read on EtoBox.

Author

Poivey, C.; Gee, G.; LaBel, K.A.; Barth, J.L.

Publisher

IEEE

Published

2004

Language

EN