About this scholarly article

2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE) - Fast Characterization of System Level ESD Noise Coupling to Real Motherboard in Notebook by Yousaf, J.; Han, J.; Lee, H.; Nah, W.; Youn, J.; Mun, S.; Lee, D.; Hwang, C. is a scholarly article available to read on EtoBox.

Author

Yousaf, J.; Han, J.; Lee, H.; Nah, W.; Youn, J.; Mun, S.; Lee, D.; Hwang, C.

Publisher

IEEE

Published

2018