About this scholarly article

2008 26th International Conference on Microelectronics - Multi-scale modeling of low dose-rate total dose effects in advanced microelectronics by Zebrev, G.I.; Gorbunov, M.S.; Osipenko, P.N. is a scholarly article available to read on EtoBox.

Author

Zebrev, G.I.; Gorbunov, M.S.; Osipenko, P.N.

Publisher

IEEE

Published

2008