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About this Engineering article
Joint Modeling of Classification and Regression for Improving Faulty Wafer Detection in Semiconductor Manufacturing by Kang, Seokho is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Kang, Seokho
- Publisher
- Springer US; Springer-Verlag; Kluwer Academic Publishers; Springer Science and Business Media LLC; Society for Mining, Metallurgy and Exploration Inc. (ISSN 0956-5515)
- Published
- 2018
- Language
- EN
- Field
- Engineering (Physical Sciences)