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Appendix 4: Jones–Mueller Matrix Conversion by Fujiwara, Hiroyuki is a scholarly article available to read on EtoBox.

What is Appendix 4: Jones–Mueller Matrix Conversion about?

Ellipsometry is a powerful tool used for the characterization of thin films and multi-layer semiconductor structures. This book deals with fundamental principles and applications of spectroscopic ellipsometry (SE). Beginning with an overview of SE technologies the text moves on to focus on the data analysis of results obtained from SE, Fundamental data analyses, principles and physical backgrounds and the various materials used in different fields from LSI industry to biotechnology are described. The final chapter describes the latest developments of real-time monitoring and process control which have attracted significant attention in various scientific and industrial fields.

Author

Fujiwara, Hiroyuki

Publisher

John Wiley & Sons, Ltd

Published

2007

Language

EN

ISBN

9780470060193