About this scholarly article

2019 IEEE 31st International Conference on Microelectronics (MIEL) - Correlation between Temperature and Dose Rate Dependences of Input Bias Current Degradation in Bipolar Operational Amplifiers by Bakerenkov, A.; Pershenkov, V.; Felitsyn, V.; Rodin, A.; Telets, V.; Belyakov, V.; Zhukov, A.; Gluhov, N. is a scholarly article available to read on EtoBox.

Author

Bakerenkov, A.; Pershenkov, V.; Felitsyn, V.; Rodin, A.; Telets, V.; Belyakov, V.; Zhukov, A.; Gluhov, N.

Publisher

IEEE

Published

2019

Language

EN