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What is Testing Transistor hFE with Pulsed Current about?
This document presents four brief ideas for circuit designs: 1. A circuit that uses pulsed current to measure the hFE of transistors on an oscilloscope, meeting manufacturer specifications. 2. A switching power supply design that ensures robust high-side FET gate control even with a fluctuating high voltage rail. 3. A simple two-transistor circuit that enables low-voltage microcontrollers to control higher-voltage loads and provides overvoltage protection. 4. A way to add short-circuit protection and
- Author
- jvs57
- Language
- EN