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About this Engineering article

Reliability of a System of k Nodes for High Performance Computing Applications by Gottumukkala, N.R.; Nassar, R.; Paun, M.; Leangsuksun, C.B.; Scott, S.L. is a Engineering article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Engineering.

Author
Gottumukkala, N.R.; Nassar, R.; Paun, M.; Leangsuksun, C.B.; Scott, S.L.
Publisher
IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9529)
Published
2010
Field
Engineering (Physical Sciences)

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