About this Engineering article
Impact of Uniaxial Strain on Random Telegraph Noise in High- $k$ /Metal Gate pMOSFETs by Huang, Po-Chin; Chen, Jone F.; Tsai, Shih Chang; Wu, San Lein; Tsai, Kai-Shiang; Kao, Tsung Hsien; Fang, Yean-Kuen; Lai, Chien-Ming; Hsu, Chia-Wei; Chen, Yi-Wen; Cheng, Osbert is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Huang, Po-Chin; Chen, Jone F.; Tsai, Shih Chang; Wu, San Lein; Tsai, Kai-Shiang; Kao, Tsung Hsien; Fang, Yean-Kuen; Lai, Chien-Ming; Hsu, Chia-Wei; Chen, Yi-Wen; Cheng, Osbert
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9383)
- Published
- 2015
- Language
- EN
- Field
- Engineering (Physical Sciences)