About this scholarly article

ECS Transactions [ECS China Semiconductor Technology International Conference 2010 (CSTIC 2010) - Shanghai, China (March 18 - March 19, 2010)] - A New BSIM3v3 SPICE Model for Reliability of Hot Carrier Injection Effect in MOSFET by Yu, Yueyun Y.; Li, Xi; Ren, Zheng; Shi, Ling Y.; Deng, ZhangPeng; Hu, Shaojian; Tang, Yi; Zhou, Wei is a scholarly article available to read on EtoBox.

Author

Yu, Yueyun Y.; Li, Xi; Ren, Zheng; Shi, Ling Y.; Deng, ZhangPeng; Hu, Shaojian; Tang, Yi; Zhou, Wei

Publisher

ECS

Published

2010

Language

EN