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X-ray Surface Reflection Fields and their Application to Absorption Corrections and to Background Patterns by M. J. Buerger is a Chemistry article available to read on EtoBox.

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A distinction is made between transmitted and surface X-ray reflections. The distribution of these two kinds of reflections on Weissenberg photographs is systematically derived for any crystal habit, for zero-and «-layer photographs, and for both the normal beam technique and the equi-inclination technique. Surface reflection fields appear to have at least two applications: 1. They are of aid in allowing for absorption in Weissenberg photographs. If the distribution of faces on the crystal is known, then the Weissenberg projection can be blocked out into contribution areas. 2. They provide an explanation for the distribution of background in Weissenberg photographs. Intense background patterns can be developed under appropriate conditions and they are characteristic of the crystal habit. It is suggested that background patterns may be of aid in the surface goniometry of crystals having faces too small or too imperfect for optical goniometric investigation. ## Introduction. In X-ray diffraction studies attention is so intensely focussed upon the lattice and structure of the crystal that its surface is usually ignored, and any effect which the crystal habit may have on diffraction st

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Author

M. J. Buerger

Published

1938

Language

EN

Field

Chemistry (Physical Sciences)