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About this Engineering article
The Leakage Currents of Amorphous Silicon Thin-film Transistors: Injection Currents, Back Channel Currents and Stress Effects by Lemmi, F.; Street, R.A. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Lemmi, F.; Street, R.A.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9383)
- Published
- 2000
- Field
- Engineering (Physical Sciences)