About this scholarly article

SPIE Proceedings [SPIE Optics East 2007 - Boston, MA (Sunday 9 September 2007)] Nanosensing: Materials, Devices, and Systems III - Characterization of localized strain of crystals in nano-scale by tip-enhanced Raman spectroscope and microscope by Hayazawa, Norihiko; Islam, M. Saif; Dutta, Achyut K.; Motohashi, Masashi; Saito, Yuika; Kawata, Satoshi is a scholarly article available to read on EtoBox.

Author

Hayazawa, Norihiko; Islam, M. Saif; Dutta, Achyut K.; Motohashi, Masashi; Saito, Yuika; Kawata, Satoshi

Publisher

SPIE

Published

2007

Language

EN