About this scholarly article

2015 IEEE 11th International Conference on the Properties and Applications of Dielectric Materials (ICPADM) - Physical damage effect of microelectrodes under nanosecond pulse induced breakdown by Meng, Guodong; Cheng, Yonghong; Dong, Chengye; Chen, Lei; Men, Chuang is a scholarly article available to read on EtoBox.

Author

Meng, Guodong; Cheng, Yonghong; Dong, Chengye; Chen, Lei; Men, Chuang

Publisher

IEEE

Published

2015

Language

EN