About this scholarly article

Proceedings International Test Conference 2001 (Cat. No.01CH37260) - Two-dimensional test data compression for scan-based deterministic BIST by Hua-Guo Liang, ; Hellebrand, S.; Wunderlich, H.-J. is a scholarly article available to read on EtoBox.

Author

Hua-Guo Liang, ; Hellebrand, S.; Wunderlich, H.-J.

Publisher

IEEE

Published

2001

Language

EN