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About this Materials Science article
Dual Lens Electron Holography for High Spatial Resolution Junction and Strain Mapping of Semiconductor Devices by Wang, Y.Y.; Bruley, J. is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Wang, Y.Y.; Bruley, J.
- Publisher
- Cambridge University Press; Cambridge University Press (CUP) (ISSN 1431-9276)
- Published
- 2014
- Language
- EN
- Field
- Materials Science (Physical Sciences)