About this scholarly article

2011 IEEE International Conference on RFID-Technologies and Applications - RFID testing and evaluation for an RF-harsh environment by Mercer, Allison J.; James, Ryan K.; Bennett, Gisele; Patel, Priyank; Johnston, Chase; Cai, James is a scholarly article available to read on EtoBox.

Author

Mercer, Allison J.; James, Ryan K.; Bennett, Gisele; Patel, Priyank; Johnston, Chase; Cai, James

Publisher

IEEE

Published

2011