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About this Engineering article
Absolute reflectivity measurements at 4479 Å of sputter deposited multilayer x-ray mirrors by Arbaoui, M. ;Barchewitz, R. ;Sella, C. ;Youn, K. B. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Arbaoui, M. ;Barchewitz, R. ;Sella, C. ;Youn, K. B.
- Publisher
- The Optical Society; Optical Society of America (ISSN 1559-128X)
- Published
- 1990
- Field
- Engineering (Physical Sciences)
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