About this scholarly article

SPIE Proceedings [SPIE Photonics West '97 - San Jose, CA (Saturday 8 February 1997)] Fabrication, Testing, and Reliability of Semiconductor Lasers II - Longitudinally resolved measurements of carrier concentration and gain in 980-nm InGaAs/GaAs high-power quantum well lasers by Bennett, Andrew J.; Sargent, Edward H.; Clayton, Rick D.; Kim, H. B.; Xu, Jing Ming; Fallahi, Mahmoud; Wang, S. C. is a scholarly article available to read on EtoBox.

Author

Bennett, Andrew J.; Sargent, Edward H.; Clayton, Rick D.; Kim, H. B.; Xu, Jing Ming; Fallahi, Mahmoud; Wang, S. C.

Publisher

SPIE

Published

1997

Language

EN