About this scholarly article

Frequency Standards and Metrology - BROADBAND FREQUENCY NOISE MEASUREMENT OF SEMICONDUCTOR LASERS IN THE 1550-NM BAND by TREMBLAY, P.; TURCOTTE, C. S.; BONDIOU, M.; GENEST, J.; ALLARD, M.; LÉVESQUE, P.; BOUCHARD, J.-P.; LATRASSE, C.; POULIN, M.; TÊTU, M. is a scholarly article available to read on EtoBox.

Author

TREMBLAY, P.; TURCOTTE, C. S.; BONDIOU, M.; GENEST, J.; ALLARD, M.; LÉVESQUE, P.; BOUCHARD, J.-P.; LATRASSE, C.; POULIN, M.; TÊTU, M.

Publisher

WORLD SCIENTIFIC

Published

2002