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About this Materials Science article
Particularities of High-voltage Electron Microscopy: Instrument Design, Defect Imaging and in Situ Investigation in 'Thick' Specimens by Valle, R.; Marraud, A. is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Valle, R.; Marraud, A.
- Publisher
- Oxford University Press; Oxford University Press (OUP) (ISSN 0022-0744)
- Published
- 1999
- Language
- EN
- Field
- Materials Science (Physical Sciences)