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About this Engineering article
Study of Tauc gap, optical density and penetration depth of vacuum evaporated Pb15Se85−xGex (x = 0, 3, 6 at. %) thin films supported by chemical bond approach and physical parameters by Sharma, Ishu; Reddy Madara, Sahith; Sharma, Pankaj is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Sharma, Ishu; Reddy Madara, Sahith; Sharma, Pankaj
- Publisher
- Elsevier ; Elsevier BV (ISSN 2214-7853)
- Published
- 2019
- Language
- EN
- Field
- Engineering (Physical Sciences)
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