About this scholarly article

SPIE Proceedings [SPIE OE/FIBERS '89 - Boston (Tuesday 5 September 1989)] Tests, Measurements, and Characterization of Electro-Optic Devices and Systems - Laser Testing of Integrated Circuits (ELASTIC®) by Jones, Robert H.; Wadekar, Shekhar G. is a scholarly article available to read on EtoBox.

Author

Jones, Robert H.; Wadekar, Shekhar G.

Publisher

SPIE

Published

1990