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About this Physics and Astronomy article
Performance Characterization of Microtomography with Complementary Metal-oxide-semiconductor Detectors for Computer-aided Defect Inspection by Kim, Ho Kyung ;Yun, Seungman ;Han, Jong Chul ;Youn, Hanbean ;Cho, Min Kook ;Lim, Chang Hwy ;Heo, Sung Kyn ;Shon, Cheol-Soon ;Kim, Seong-Sik ;Cho, Bong Hae ;Achterkirchen, Thorsten Graeve is a Physics and Astronomy article available to read on EtoBox.
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- Author
- Kim, Ho Kyung ;Yun, Seungman ;Han, Jong Chul ;Youn, Hanbean ;Cho, Min Kook ;Lim, Chang Hwy ;Heo, Sung Kyn ;Shon, Cheol-Soon ;Kim, Seong-Sik ;Cho, Bong Hae ;Achterkirchen, Thorsten Graeve
- Publisher
- American Institute of Physics; AIP Publishing; Publons (ISSN 0021-8979)
- Published
- 2009
- Field
- Physics and Astronomy (Physical Sciences)