About this scholarly article

SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 18 June 2007)] Optical Measurement Systems for Industrial Inspection V - Implementation a new real-time structure for driving an IRFPA and image enhancement by Homaei, Ali; Koohestani, Ehsan; Osten, Wolfgang; Gorecki, Christophe; Novak, Erik L. is a scholarly article available to read on EtoBox.

Author

Homaei, Ali; Koohestani, Ehsan; Osten, Wolfgang; Gorecki, Christophe; Novak, Erik L.

Publisher

SPIE

Published

2007