Can I read VLSI Delay Testing Techniques Explained on EtoBox?

VLSI Delay Testing Techniques Explained by Soumick Chakraborty is a document available to read on EtoBox.

What is VLSI Delay Testing Techniques Explained about?

The document discusses delay testing in VLSI circuits, focusing on delay faults and path-delay tests. It defines critical paths, robust and non-robust tests, and outlines methodologies for testing delay faults in combinational and sequential circuits. Various test generation techniques and their implications on circuit reliability are also explored.

Author

Soumick Chakraborty

Language

EN